Atomic Force Microscopy Based Nanorobotics: Modelling, by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

By Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

The atomic strength microscope (AFM) has been effectively used to accomplish nanorobotic manipulation operations on nanoscale entities akin to debris, nanotubes, nanowires, nanocrystals, and DNA due to the fact Nineties.

There were many growth on modeling, imaging, teleoperated or automatic regulate, human-machine interfacing, instrumentation, and functions of AFM dependent nanorobotic manipulation platforms in literature. This e-book goals to incorporate all of such state of the art growth in an equipped, established, and unique demeanour as a reference e-book and likewise possibly a textbook in nanorobotics and the other nanoscale dynamics, platforms and controls comparable examine and schooling.

Clearly written and well-organized, this article introduces designs and prototypes of the nanorobotic platforms intimately with cutting edge ideas of 3-dimensional manipulation strength microscopy and parallel imaging/manipulation strength microscopy.

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Additional info for Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

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3 Tip Array for Parallel Manipulation The manipulation tool possessing more than two tips to an tip array might be potentially used for mass production. It can be imaged that if a tip array, consisting of hundreds of tips on a single chip, is used for nanomaipulation, hundreds of targets can be manipulated correspondingly at one time. The tip array greatly increase the manipulation efficiency by hundreds of times as compared with single point manipulation. The AFM tip array was firstly introduced by IBM for the purpose of batch fabrication of high-density data storage [47].

The first involves mounting the piezoresistive cantilever vertically on the AFM stage along its longitudinal axis (see Fig. 4(a)), termed top loading, which reduces the mounting area at the cost of height space. 2 (d)). Nevertheless, if the piezoresistive cantilever is too high (8mm in our experiments), the piezoresistive cantilever can be mounted in the second way: horizontally on the AFM stage (see Fig. 4(b)), termed side loading. 1 Force Calibration Issues in AFM (Normal Force and Lateral Force Calibration) 39 Fig.

Another shortcoming is that nanoparticle pushing on the fast scan line could not be deliberately performed or the nanoparticle motion is difficult to control. Therefore, such a simultaneous nanomanipulation with a single AFM tip can not push a nanoparticle to any points on the surface and thus can not arbitrarily produce two-dimensional nanoparticle nanopatterns. 2 Two-Tip Parallel Manipulation AFM As we discussed, performing imaging and manipulation in parallel is the key to speed up AFM based nanomanipulation.

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